Test data compression and decompression based on internal scan chains and Golomb coding

Journal Article (Journal Article)

We present a data compression method and decompression architecture for testing embedded cores in a system-on-a-chip (SOC). The proposed approach makes effective use of Golomb coding and the infernal scan chain(s) of the core under test and provides significantly better results than a recent compression method that uses Golomb coding and a separate cyclical scan register (CSR). The major advantages of Golomb coding of test data include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. The use of the internal scan chain for decompression obviates the need for a CSR, thereby reducing hardware overhead considerably. In addition, the novel interleaving decompression architecture allows multiple cores in an SOC to be tested concurrently using a single ATE I/O channel. We demonstrate the effectiveness of the proposed approach by applying it to the ISCAS 89 benchmark circuits.

Full Text

Duke Authors

Cited Authors

  • Chandra, A; Chakrabarty, K

Published Date

  • June 1, 2002

Published In

Volume / Issue

  • 21 / 6

Start / End Page

  • 715 - 722

International Standard Serial Number (ISSN)

  • 0278-0070

Digital Object Identifier (DOI)

  • 10.1109/TCAD.2002.1004315

Citation Source

  • Scopus