Simple method of obtaining Si(Li) detector efficiency

Published

Journal Article

The efficiency of a semi-conductor detector is measured by compairing its response with that of an NaI(Tl) detector of known efficiency when both are exposed to the same flux of gamma-excited fluorescent X-rays. The experimental procedure is outlined and corrections and limitations are discussed. The technique is an inexpensive and convenient way of determining semi-conductor efficiency up to about 100 keV using a single radionuclide source of modest activity and readily-available fluorescers. © 1978.

Full Text

Duke Authors

Cited Authors

  • Johnson, GA; Manson, EL; O'Foghludha, F

Published Date

  • May 1, 1978

Published In

Volume / Issue

  • 151 / 1-2

Start / End Page

  • 217 - 220

International Standard Serial Number (ISSN)

  • 0029-554X

Digital Object Identifier (DOI)

  • 10.1016/0029-554X(78)90491-3

Citation Source

  • Scopus