Simple method of obtaining Si(Li) detector efficiency
Journal Article (Journal Article)
The efficiency of a semi-conductor detector is measured by compairing its response with that of an NaI(Tl) detector of known efficiency when both are exposed to the same flux of gamma-excited fluorescent X-rays. The experimental procedure is outlined and corrections and limitations are discussed. The technique is an inexpensive and convenient way of determining semi-conductor efficiency up to about 100 keV using a single radionuclide source of modest activity and readily-available fluorescers. © 1978.
Full Text
Duke Authors
Cited Authors
- Johnson, GA; Manson, EL; O'Foghludha, F
Published Date
- May 1, 1978
Published In
Volume / Issue
- 151 / 1-2
Start / End Page
- 217 - 220
International Standard Serial Number (ISSN)
- 0029-554X
Digital Object Identifier (DOI)
- 10.1016/0029-554X(78)90491-3
Citation Source
- Scopus