Exponential decay of local conductance in single-wall carbon nanotubes

Published

Journal Article

We have measured the decay of local conductance in single-wall carbon nanotubes directly using conductance imaging atomic force microscopy. The decay lengths were in the range from 190nm to well over 3μm. There are strong indications that these decay lengths are the result of depletion lengths around metallic/semiconducting carbon nanotube junctions, and that they are related to defects in the tubes. © 2005 The American Physical Society.

Full Text

Duke Authors

Cited Authors

  • Stadermann, M; Papadakis, SJ; Falvo, MR; Fu, Q; Liu, J; Fridman, Y; Boland, JJ; Superfine, R; Washburn, S

Published Date

  • December 15, 2005

Published In

Volume / Issue

  • 72 / 24

Electronic International Standard Serial Number (EISSN)

  • 1550-235X

International Standard Serial Number (ISSN)

  • 1098-0121

Digital Object Identifier (DOI)

  • 10.1103/PhysRevB.72.245406

Citation Source

  • Scopus