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Correction for specimen movement after acquisition of element-specific electron microprobe images

Publication ,  Journal Article
Lamvik, MK; Ingram, P; Menon, RG; Beese, LS; Davilla, SD; LeFurgey, A
Published in: Journal of Microscopy
1989

Duke Scholars

Published In

Journal of Microscopy

ISSN

0022-2720

Publication Date

1989

Volume

156

Issue

2

Start / End Page

183 / 190

Related Subject Headings

  • Microscopy
  • 0912 Materials Engineering
  • 0601 Biochemistry and Cell Biology
  • 0204 Condensed Matter Physics
 

Citation

APA
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ICMJE
MLA
NLM
Lamvik, M. K., Ingram, P., Menon, R. G., Beese, L. S., Davilla, S. D., & LeFurgey, A. (1989). Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy, 156(2), 183–190.
Lamvik, M. K., P. Ingram, R. G. Menon, L. S. Beese, S. D. Davilla, and A. LeFurgey. “Correction for specimen movement after acquisition of element-specific electron microprobe images.” Journal of Microscopy 156, no. 2 (1989): 183–90.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy. 1989;156(2):183–90.
Lamvik, M. K., et al. “Correction for specimen movement after acquisition of element-specific electron microprobe images.” Journal of Microscopy, vol. 156, no. 2, 1989, pp. 183–90.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy. 1989;156(2):183–190.
Journal cover image

Published In

Journal of Microscopy

ISSN

0022-2720

Publication Date

1989

Volume

156

Issue

2

Start / End Page

183 / 190

Related Subject Headings

  • Microscopy
  • 0912 Materials Engineering
  • 0601 Biochemistry and Cell Biology
  • 0204 Condensed Matter Physics