Pencil beam coded aperture x-ray scatter imaging


Journal Article

We use coded aperture x-ray scatter imaging to interrogate scattering targets with a pencil beam. Observations from a single x-ray exposure of a flat-panel scintillation detector are used to simultaneously determine the along-beam positions and momentum transfer profiles of two crystalline powders (NaCl and Al). The system operates with a 3 cm range resolution and a momentum transfer resolution of 0.1 nm 1. These results demonstrate that a single snapshot can be used to estimate scattering properties along an x-ray beam, and serve as a foundation for volumetric imaging of scattering objects. © 2012 Optical Society of America.

Full Text

Duke Authors

Cited Authors

  • MacCabe, K; Krishnamurthy, K; Chawla, A; Marks, D; Samei, E; Brady, D

Published Date

  • July 16, 2012

Published In

Volume / Issue

  • 20 / 15

Start / End Page

  • 16310 - 16320

Electronic International Standard Serial Number (EISSN)

  • 1094-4087

Digital Object Identifier (DOI)

  • 10.1364/OE.20.016310

Citation Source

  • Scopus