Stacked thin film InGaAs and GaAs photodetectors for fully registered wavelength discrimination

Journal Article

The fabrication and characterization of co-located, 3D stacked thin film PDs was carried out. Independent electrical access to each of the two spatially co-located photodetectors was demonstrated, with two different wavelengths successfully resolved.

Duke Authors

Cited Authors

  • Seo, SW; Geddis, DL; Jokerst, NM; Brooke, MA

Published Date

  • January 1, 2002

Published In

Volume / Issue

  • 2 /

Start / End Page

  • 841 - 842

International Standard Serial Number (ISSN)

  • 1092-8081

Citation Source

  • Scopus