Stacked thin film InGaAs and GaAs photodetectors for fully registered wavelength discrimination
Journal Article
The fabrication and characterization of co-located, 3D stacked thin film PDs was carried out. Independent electrical access to each of the two spatially co-located photodetectors was demonstrated, with two different wavelengths successfully resolved.
Duke Authors
Cited Authors
- Seo, SW; Geddis, DL; Jokerst, NM; Brooke, MA
Published Date
- January 1, 2002
Published In
Volume / Issue
- 2 /
Start / End Page
- 841 - 842
International Standard Serial Number (ISSN)
- 1092-8081
Citation Source
- Scopus