Statistical modeling of 3-D parallel-plate embedded capacitors using Monte Carlo simulation

Published

Journal Article

Examination of the statistical variation of integrated passive components is crucial for designing and characterizing the performance of multichip module (MCM) substrates. In this paper, the statistical analysis of parallel plate capacitors with gridded plates manufactured in a multilayer low temperature cofired ceramic (LTCC) process is presented. A set of integrated capacitor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 MHz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the capacitor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall capacitor performance.

Full Text

Duke Authors

Cited Authors

  • Yun, L; Poddar, R; Carastro, L; Brooke, M; May, GS

Published Date

  • January 1, 2001

Published In

Volume / Issue

  • 23 / 1

Start / End Page

  • 23 - 32

International Standard Serial Number (ISSN)

  • 1225-6463

Digital Object Identifier (DOI)

  • 10.4218/etrij.01.0101.0104

Citation Source

  • Scopus