Statistical analysis of embedded capacitors using Monte Carlo simulation
Publication
, Journal Article
Carastro, L; Yun, I; Poddar, R; Brooke, M; May, GS
Published in: Proceedings - Electronic Components and Technology Conference
December 1, 2000
A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.
Duke Scholars
Published In
Proceedings - Electronic Components and Technology Conference
ISSN
0569-5503
Publication Date
December 1, 2000
Start / End Page
198 / 205
Citation
APA
Chicago
ICMJE
MLA
NLM
Carastro, L., Yun, I., Poddar, R., Brooke, M., & May, G. S. (2000). Statistical analysis of embedded capacitors using Monte Carlo simulation. Proceedings - Electronic Components and Technology Conference, 198–205.
Carastro, L., I. Yun, R. Poddar, M. Brooke, and G. S. May. “Statistical analysis of embedded capacitors using Monte Carlo simulation.” Proceedings - Electronic Components and Technology Conference, December 1, 2000, 198–205.
Carastro L, Yun I, Poddar R, Brooke M, May GS. Statistical analysis of embedded capacitors using Monte Carlo simulation. Proceedings - Electronic Components and Technology Conference. 2000 Dec 1;198–205.
Carastro, L., et al. “Statistical analysis of embedded capacitors using Monte Carlo simulation.” Proceedings - Electronic Components and Technology Conference, Dec. 2000, pp. 198–205.
Carastro L, Yun I, Poddar R, Brooke M, May GS. Statistical analysis of embedded capacitors using Monte Carlo simulation. Proceedings - Electronic Components and Technology Conference. 2000 Dec 1;198–205.
Published In
Proceedings - Electronic Components and Technology Conference
ISSN
0569-5503
Publication Date
December 1, 2000
Start / End Page
198 / 205