Statistical analysis of embedded capacitors using Monte Carlo simulation


Journal Article

A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.

Duke Authors

Cited Authors

  • Carastro, L; Yun, I; Poddar, R; Brooke, M; May, GS

Published Date

  • December 1, 2000

Published In

Start / End Page

  • 198 - 205

International Standard Serial Number (ISSN)

  • 0569-5503

Citation Source

  • Scopus