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Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide

Publication ,  Journal Article
Losurdo, M; Bruno, G; Kim, TH; Choi, S; Brown, A
Published in: Applied Physics Letters
March 20, 2006

The complex dielectric function of hexagonal InN has been determined in the 0.72-6.50 eV photon energy range using spectroscopic ellipsometry. The InN films have been synthesized using molecular beam epitaxy on Si-face 6H-SiC (0001) substrates. The fundamental band gap E 0 and higher energy interband critical points have been identified at room temperature. The impact of indium clusters and of the InN native oxide on the dielectric function is discussed. © 2006 American Institute of Physics.

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Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

March 20, 2006

Volume

88

Issue

12

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

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Losurdo, M., Bruno, G., Kim, T. H., Choi, S., & Brown, A. (2006). Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide. Applied Physics Letters, 88(12). https://doi.org/10.1063/1.2190461
Losurdo, M., G. Bruno, T. H. Kim, S. Choi, and A. Brown. “Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide.” Applied Physics Letters 88, no. 12 (March 20, 2006). https://doi.org/10.1063/1.2190461.
Losurdo M, Bruno G, Kim TH, Choi S, Brown A. Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide. Applied Physics Letters. 2006 Mar 20;88(12).
Losurdo, M., et al. “Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide.” Applied Physics Letters, vol. 88, no. 12, Mar. 2006. Scopus, doi:10.1063/1.2190461.
Losurdo M, Bruno G, Kim TH, Choi S, Brown A. Study of the dielectric function of hexagonal InN: Impact of indium clusters and of native oxide. Applied Physics Letters. 2006 Mar 20;88(12).

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

March 20, 2006

Volume

88

Issue

12

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences