Diagnosis of board-level functional failures under uncertainty using Dempster-Shafer theory

Journal Article (Journal Article)

Despite recent advances in structural test methods, the diagnosis of the root cause of board-level failures for functional tests remains a major challenge. A promising approach to address this problem is to carry out fault diagnosis in two phasessuspect faulty components on the board or modules within components (together referred to as blocks in this paper) are first identified and ranked, and then fine-grained diagnosis is used to target the suspect blocks in a ranked order. We propose a new method based on dataflow analysis and Dempster-Shafer (DS) theory for ranking faulty blocks in the first phase of diagnosis. The proposed approach transforms the information derived from one functional test failure into multiple-stage failures by partitioning the given functional test into multiple stages. A measure of belief is then assigned to each block based on the knowledge of each failing stage, and the DS theory is subsequently used to aggregate the beliefs from multiple failing stages. Blocks with higher beliefs are ranked on the top of the candidate list. Simulations on an industry design for a network interface application as well as on an open source system-on-a-chip show that the proposed method can provide accurate ranking for most board-level functional failures. © 2012 IEEE.

Full Text

Duke Authors

Cited Authors

  • Fang, H; Chakrabarty, K; Wang, Z; Gu, X

Published Date

  • September 28, 2012

Published In

Volume / Issue

  • 31 / 10

Start / End Page

  • 1586 - 1599

International Standard Serial Number (ISSN)

  • 0278-0070

Digital Object Identifier (DOI)

  • 10.1109/TCAD.2012.2198884

Citation Source

  • Scopus