MVP: Minimum-violations partitioning for reducing capture power in at-speed delay-fault testing

Published

Journal Article

Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this paper, we propose minimum-violations partitioning, a scan-cell clustering method that can support multiple capture cycles in delay testing without increasing test-data volume. This method is based on an integer linear programming model and it can cluster the scan flip-flops into balanced parts with minimum capture violations. Based on this approach, hierarchical partitioning is proposed to make the partitioning method routing-aware. Experimental results on ISCAS'89 and IWLS'05 benchmark circuits demonstrate the effectiveness of our method. © 2011 IEEE.

Full Text

Duke Authors

Cited Authors

  • Chen, Z; Chakrabarty, K; Xiang, D

Published Date

  • November 1, 2011

Published In

Volume / Issue

  • 30 / 11

Start / End Page

  • 1762 - 1767

International Standard Serial Number (ISSN)

  • 0278-0070

Digital Object Identifier (DOI)

  • 10.1109/TCAD.2011.2162237

Citation Source

  • Scopus