Test-set embedding based on width compression for mixed-mode BIST

Journal Article (Journal Article)

We present a new test generator circuit (TGC) for mixed-mode built-in self-test (BIST) that embeds a precomputed deterministic test set T D in a longer sequence. The design method employs width compression based on the property of d-compatibles. To demonstrate the feasibility of the TGC design methods, we present experimental data for single stuck-at test sets for the ISCAS 85 circuits and full-scan versions of the ISCAS 89 benchmark circuits. We also achieve significant improvement over another recently-proposed mixed-mode TGC design scheme for BIST.

Full Text

Duke Authors

Cited Authors

  • Chakrabarty, K; Das, SR

Published Date

  • June 1, 2000

Published In

Volume / Issue

  • 49 / 3

Start / End Page

  • 671 - 678

International Standard Serial Number (ISSN)

  • 0018-9456

Digital Object Identifier (DOI)

  • 10.1109/19.850413

Citation Source

  • Scopus