Measurement system for the high-throughput characterization of metal nanoparticles for biosensors


Journal Article

We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography. © 2005 Optical Society of America.

Full Text

Duke Authors

Cited Authors

  • Curry, A; Nusz, G; Chilkoti, A; Wax, A

Published Date

  • January 1, 2005

Published In

  • 2005 Conference on Lasers and Electro Optics, Cleo

Volume / Issue

  • 3 /

Start / End Page

  • 2160 - 2162

Digital Object Identifier (DOI)

  • 10.1109/cleo.2005.202402

Citation Source

  • Scopus