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Bayesian Local Contamination Models for Multivariate Outliers.

Publication ,  Journal Article
Page, GL; Dunson, DB
Published in: Technometrics : a journal of statistics for the physical, chemical, and engineering sciences
May 2011

In studies where data are generated from multiple locations or sources it is common for there to exist observations that are quite unlike the majority. Motivated by the application of establishing a reference value in an inter-laboratory setting when outlying labs are present, we propose a local contamination model that is able to accommodate unusual multivariate realizations in a flexible way. The proposed method models the process level of a hierarchical model using a mixture with a parametric component and a possibly nonparametric contamination. Much of the flexibility in the methodology is achieved by allowing varying random subsets of the elements in the lab-specific mean vectors to be allocated to the contamination component. Computational methods are developed and the methodology is compared to three other possible approaches using a simulation study. We apply the proposed method to a NIST/NOAA sponsored inter-laboratory study which motivated the methodological development.

Duke Scholars

Published In

Technometrics : a journal of statistics for the physical, chemical, and engineering sciences

DOI

ISSN

0040-1706

Publication Date

May 2011

Volume

53

Issue

2

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics
 

Citation

APA
Chicago
ICMJE
MLA
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Page, G. L., & Dunson, D. B. (2011). Bayesian Local Contamination Models for Multivariate Outliers. Technometrics : A Journal of Statistics for the Physical, Chemical, and Engineering Sciences, 53(2). https://doi.org/10.1198/tech.2011.10041
Page, Garritt L., and David B. Dunson. “Bayesian Local Contamination Models for Multivariate Outliers.Technometrics : A Journal of Statistics for the Physical, Chemical, and Engineering Sciences 53, no. 2 (May 2011). https://doi.org/10.1198/tech.2011.10041.
Page GL, Dunson DB. Bayesian Local Contamination Models for Multivariate Outliers. Technometrics : a journal of statistics for the physical, chemical, and engineering sciences. 2011 May;53(2).
Page, Garritt L., and David B. Dunson. “Bayesian Local Contamination Models for Multivariate Outliers.Technometrics : A Journal of Statistics for the Physical, Chemical, and Engineering Sciences, vol. 53, no. 2, May 2011. Epmc, doi:10.1198/tech.2011.10041.
Page GL, Dunson DB. Bayesian Local Contamination Models for Multivariate Outliers. Technometrics : a journal of statistics for the physical, chemical, and engineering sciences. 2011 May;53(2).
Journal cover image

Published In

Technometrics : a journal of statistics for the physical, chemical, and engineering sciences

DOI

ISSN

0040-1706

Publication Date

May 2011

Volume

53

Issue

2

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics