Application of frequency domain techniques to samples with moderate scatter
Publication
, Journal Article
Gerken, M; Godfrey, D; Faris, GW
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 1999
We show that the optical properties of a sample with moderate scatter can be obtained by performing frequency domain measurements in a reflection geometry. In experiments and Monte Carlo simulations we show that absorption and scatter produce opposing trends in the amplitude signal and common trends in the phase signal. Therefore a measured amplitude and phase signal correspond to a unique combination of optical properties for a given phase function.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
ISSN
0277-786X
Publication Date
January 1, 1999
Volume
3599
Start / End Page
86 / 92
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Gerken, M., Godfrey, D., & Faris, G. W. (1999). Application of frequency domain techniques to samples with moderate scatter. Proceedings of SPIE - The International Society for Optical Engineering, 3599, 86–92.
Gerken, M., D. Godfrey, and G. W. Faris. “Application of frequency domain techniques to samples with moderate scatter.” Proceedings of SPIE - The International Society for Optical Engineering 3599 (January 1, 1999): 86–92.
Gerken M, Godfrey D, Faris GW. Application of frequency domain techniques to samples with moderate scatter. Proceedings of SPIE - The International Society for Optical Engineering. 1999 Jan 1;3599:86–92.
Gerken, M., et al. “Application of frequency domain techniques to samples with moderate scatter.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 3599, Jan. 1999, pp. 86–92.
Gerken M, Godfrey D, Faris GW. Application of frequency domain techniques to samples with moderate scatter. Proceedings of SPIE - The International Society for Optical Engineering. 1999 Jan 1;3599:86–92.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
ISSN
0277-786X
Publication Date
January 1, 1999
Volume
3599
Start / End Page
86 / 92
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering