Structured oblique illumination microscopy for enhanced resolution imaging of non-fluorescent, coherently scattering samples.


Journal Article

Many biological structures of interest are beyond the diffraction limit of conventional microscopes and their visualization requires application of super-resolution techniques. Such techniques have found remarkable success in surpassing the diffraction limit to achieve sub-diffraction limited resolution; however, they are predominantly limited to fluorescent samples. Here, we introduce a non-fluorescent analogue to structured illumination microscopy, termed structured oblique illumination microscopy (SOIM), where we use simultaneous oblique illuminations of the sample to multiplex high spatial-frequency content into the frequency support of the system. We introduce a theoretical framework describing how to demodulate this multiplexed information to reconstruct an image with a spatial-frequency support exceeding that of the system's classical diffraction limit. This approach allows enhanced-resolution imaging of non-fluorescent samples. Experimental confirmation of the approach is obtained in a reflection test target with moderate numerical aperture.

Full Text

Duke Authors

Cited Authors

  • Chowdhury, S; Dhalla, A-H; Izatt, J

Published Date

  • August 2012

Published In

Volume / Issue

  • 3 / 8

Start / End Page

  • 1841 - 1854

PubMed ID

  • 22876348

Pubmed Central ID

  • 22876348

Electronic International Standard Serial Number (EISSN)

  • 2156-7085

International Standard Serial Number (ISSN)

  • 2156-7085

Digital Object Identifier (DOI)

  • 10.1364/boe.3.001841


  • eng