Determining Q using S parameter data

Journal Article

A method is presented for determining frequency selectivity (Q) of a network using scattering (S) parameter data, data that is readily available from network measurements or analysis. The approach is based on a formulation for Q that uses the change in reactance of the resonant circuit with frequency. The method yields accurate Q results for both high and low Q resonators. Furthermore, the method is easy to implement and to understand. An example is given for calculating the Q of a tapped-stub resonator. Using this example, the new method is compared to the critical points (CP) method, an approach based on a Foster network type of formulation. © 1996 IEEE.

Duke Authors

Cited Authors

  • Drozd, JM; Joines, WT

Published Date

  • 1996

Published In

Volume / Issue

  • 44 / 11

Start / End Page

  • 2122 - 2127

International Standard Serial Number (ISSN)

  • 0018-9480