Time resolved photoluminescence studies on transferred thin film InP epilayers

Journal Article

Time-resolved photoluminescence (TRPL) data are reported for the first time on InP thin films transferred on glass substrates. The films were kept below 1.1 μm in thickness to reduce the photon recycling effect. The data were taken by means of the time-correlated single photon counting technique. The thin films were grown by the liquid phase epitaxial process. The lower doped n-type samples showed evidence of Shockley-Read-Hall (SRH) recombination. For higher electron densities, the lifetime is found to be controlled by the radiative recombination process and an estimate of the B coefficient was made in terms of the photon recycling factor.

Duke Authors

Cited Authors

  • Augustine, G; Keyes, BM; Jokerst, NM; Rohatgi, A; Ahrenkiel, RK

Published Date

  • 1993

Published In

  • 1993 IEEE 5th International Conference on Indium Phosphide and Related Materials

Start / End Page

  • 636 - 639