Emittance and current of electrons trapped in a plasma wakefield accelerator
Publication
, Journal Article
Kirby, N; Blumenfeld, I; Clayton, CE; Decker, FJ; Hogan, MJ; Huang, C; Ischebeck, R; Iverson, RH; Joshi, C; Katsouleas, T; Lu, W; Marsh, KA ...
Published in: AIP Conference Proceedings
2009
In recent experiments plasma electrons became trapped in a plasma wakefield accelerator (PWFA). The transverse size of these trapped electrons on a downstream diagnostic yields an upper limit measurement of transverse normalized emittance divided by peak current, εNXI The lowest upper limit for εNXI measured in the experiment is 1.3 10-10m/A. © 2009 American Institute of Physics.
Published In
AIP Conference Proceedings
DOI
ISSN
0094-243X
Publication Date
2009
Volume
1086
Start / End Page
591 / 596
Citation
APA
Chicago
ICMJE
MLA
NLM
Kirby, N., Blumenfeld, I., Clayton, C. E., Decker, F. J., Hogan, M. J., Huang, C., … Zhou, M. (2009). Emittance and current of electrons trapped in a plasma wakefield accelerator. AIP Conference Proceedings, 1086, 591–596. https://doi.org/10.1063/1.3080974
Kirby, N., I. Blumenfeld, C. E. Clayton, F. J. Decker, M. J. Hogan, C. Huang, R. Ischebeck, et al. “Emittance and current of electrons trapped in a plasma wakefield accelerator.” AIP Conference Proceedings 1086 (2009): 591–96. https://doi.org/10.1063/1.3080974.
Kirby N, Blumenfeld I, Clayton CE, Decker FJ, Hogan MJ, Huang C, et al. Emittance and current of electrons trapped in a plasma wakefield accelerator. AIP Conference Proceedings. 2009;1086:591–6.
Kirby, N., et al. “Emittance and current of electrons trapped in a plasma wakefield accelerator.” AIP Conference Proceedings, vol. 1086, 2009, pp. 591–96. Scival, doi:10.1063/1.3080974.
Kirby N, Blumenfeld I, Clayton CE, Decker FJ, Hogan MJ, Huang C, Ischebeck R, Iverson RH, Joshi C, Katsouleas T, Lu W, Marsh KA, Martins S, Mori WB, Muggli P, Oz E, Siemann RH, Walz DR, Zhou M. Emittance and current of electrons trapped in a plasma wakefield accelerator. AIP Conference Proceedings. 2009;1086:591–596.
Published In
AIP Conference Proceedings
DOI
ISSN
0094-243X
Publication Date
2009
Volume
1086
Start / End Page
591 / 596