The CDF intermediate silicon layers detector

Published

Journal Article

Duke Authors

Cited Authors

  • Affolder, A; Azzi-Bacchetta, P; Bacchetta, N; Barbaro-Galtieri, A; Barker, G; Basti, A; Bedeschi, F; Bisello, D; Blusk, S; Caskey, W; Chiarelli, G; Connolly, A; Demina, R; Ely, R; Field, R; Garcia-Sciveres, M; Giolo, K; Goldstein, D; Goldstein, J; Grim, G; Guerzoni, M; Haas, R; Haber, C; Hara, K; Hartmann, F; Heiss, A; Hill, C; Hrycyk, M; Incandela, J; Kato, Y; Knoblauch, D; Kruse, M; Lander, R; Lei, CM; Leonardi, G; Leone, S; Martignon, G; Miyazaky, Y; Moggi, A; Muller, T; Munar, A; Okusawa, T; Palmonari, F; Paulini, M; Pellett, D; Piacentino, G; Raffaelli, F; Roederer, F; Saltzberg, D; Schilling, M; Shimojima, M; Stuart, D; Takano, T; Takikawa, K; Tanaka, M; Tipton, P; Turini, N; Volobouev, I; Yao, W; Yoshida, T; Wenzel, H; Wilkes, T; Zetti, F; Zucchelli, S

Published Date

  • November 1, 1999

Published In

Volume / Issue

  • 112 / 11

Start / End Page

  • 1351 - 1357

International Standard Serial Number (ISSN)

  • 0369-3546

Citation Source

  • Scopus