Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors

Journal Article (Journal Article)

Scanning tunneling microscopy (STM) exploits the extreme distance sensitivity of electron tunneling to achieve atomic resolution imaging of surfaces. The ability of STM to probe directly materials on the atomic scale has been exploited to elucidate the structural effects of metal substitution in the copper oxide superconductor Bi Sr CuO . A series of Bi Sr CuO single crystals containing lead substituted in the bismuth-oxide layer have been prepared, and the structures of these materials have been characterized by STM. The measurements show that lead-substitution induces complex changes in the structural order of the parent compound. Comparisons of these data with electron diffraction measurements highlight the importance of local crystallography, which STM provides, in studying the chemistry of inorganic materials. 2 2 6 2 2 6

Full Text

Duke Authors

Cited Authors

  • Liu, J; Lieber, CM

Published Date

  • February 29, 1996

Published In

Volume / Issue

  • 243 / 1-2

Start / End Page

  • 305 - 308

International Standard Serial Number (ISSN)

  • 0020-1693

Digital Object Identifier (DOI)

  • 10.1016/0020-1693(95)04920-7

Citation Source

  • Scopus