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Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors

Publication ,  Journal Article
Liu, J; Lieber, CM
Published in: Inorganica Chimica Acta
February 29, 1996

Scanning tunneling microscopy (STM) exploits the extreme distance sensitivity of electron tunneling to achieve atomic resolution imaging of surfaces. The ability of STM to probe directly materials on the atomic scale has been exploited to elucidate the structural effects of metal substitution in the copper oxide superconductor Bi2Sr2CuO6. A series of Bi2Sr2CuO6 single crystals containing lead substituted in the bismuth-oxide layer have been prepared, and the structures of these materials have been characterized by STM. The measurements show that lead-substitution induces complex changes in the structural order of the parent compound. Comparisons of these data with electron diffraction measurements highlight the importance of local crystallography, which STM provides, in studying the chemistry of inorganic materials.

Duke Scholars

Published In

Inorganica Chimica Acta

DOI

ISSN

0020-1693

Publication Date

February 29, 1996

Volume

243

Issue

1-2

Start / End Page

305 / 308

Related Subject Headings

  • Inorganic & Nuclear Chemistry
  • 3402 Inorganic chemistry
  • 0399 Other Chemical Sciences
  • 0306 Physical Chemistry (incl. Structural)
  • 0302 Inorganic Chemistry
 

Citation

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Liu, J., & Lieber, C. M. (1996). Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors. Inorganica Chimica Acta, 243(1–2), 305–308. https://doi.org/10.1016/0020-1693(95)04920-7
Liu, J., and C. M. Lieber. “Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors.” Inorganica Chimica Acta 243, no. 1–2 (February 29, 1996): 305–8. https://doi.org/10.1016/0020-1693(95)04920-7.
Liu J, Lieber CM. Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors. Inorganica Chimica Acta. 1996 Feb 29;243(1–2):305–8.
Liu, J., and C. M. Lieber. “Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors.” Inorganica Chimica Acta, vol. 243, no. 1–2, Feb. 1996, pp. 305–08. Scopus, doi:10.1016/0020-1693(95)04920-7.
Liu J, Lieber CM. Electron tunneling microscopy: A direct probe of metal substitution in BiSrCaCuO superconductors. Inorganica Chimica Acta. 1996 Feb 29;243(1–2):305–308.
Journal cover image

Published In

Inorganica Chimica Acta

DOI

ISSN

0020-1693

Publication Date

February 29, 1996

Volume

243

Issue

1-2

Start / End Page

305 / 308

Related Subject Headings

  • Inorganic & Nuclear Chemistry
  • 3402 Inorganic chemistry
  • 0399 Other Chemical Sciences
  • 0306 Physical Chemistry (incl. Structural)
  • 0302 Inorganic Chemistry