Skip to main content

Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse

Publication ,  Journal Article
Kong, FZ; Yin, WY; Mao, JF; Liu, QH
Published in: IEEE Transactions on Advanced Packaging
August 1, 2010

A comprehensive electro-thermo-mechanical transient investigation is carried out to characterize time-dependent thermal and mechanical responses of metal wire bonding interconnects, as they suffer from the impact of an electromagnetic pulse (EMP) with different current or voltage waveforms. In our mathematical implementation, a hybrid time-domain finite element method is applied to simulate mutual interactions among electrical, thermal, and mechanical fields, with all nonlinearities of temperature-dependent electrical conductivities, thermal conductivities, thermal expansion coefficients, and even the Young's modulus of materials being treated appropriately. The developed algorithm is partially validated by computing transient temperature and thermal stress of other interconnects with good agreement with reference results. Parametric studies are performed to show the effects of EMP waveform parameters, geometrical and physical parameters of various wire bonding interconnects on their transient thermal and mechanical responses, thus providing basic information for their electromagnetic protection so as to suppress the impact of an intentional EMP. © 2006 IEEE.

Published In

IEEE Transactions on Advanced Packaging

DOI

ISSN

1521-3323

Publication Date

August 1, 2010

Volume

33

Issue

3

Start / End Page

729 / 737

Related Subject Headings

  • Networking & Telecommunications
  • Electrical & Electronic Engineering
  • 0910 Manufacturing Engineering
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Kong, F. Z., Yin, W. Y., Mao, J. F., & Liu, Q. H. (2010). Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse. IEEE Transactions on Advanced Packaging, 33(3), 729–737. https://doi.org/10.1109/TADVP.2010.2048902
Kong, F. Z., W. Y. Yin, J. F. Mao, and Q. H. Liu. “Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse.” IEEE Transactions on Advanced Packaging 33, no. 3 (August 1, 2010): 729–37. https://doi.org/10.1109/TADVP.2010.2048902.
Kong FZ, Yin WY, Mao JF, Liu QH. Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse. IEEE Transactions on Advanced Packaging. 2010 Aug 1;33(3):729–37.
Kong, F. Z., et al. “Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse.” IEEE Transactions on Advanced Packaging, vol. 33, no. 3, Aug. 2010, pp. 729–37. Scopus, doi:10.1109/TADVP.2010.2048902.
Kong FZ, Yin WY, Mao JF, Liu QH. Electro-thermo-mechanical characterizations of various wire bonding interconnects illuminated by an electromagnetic pulse. IEEE Transactions on Advanced Packaging. 2010 Aug 1;33(3):729–737.

Published In

IEEE Transactions on Advanced Packaging

DOI

ISSN

1521-3323

Publication Date

August 1, 2010

Volume

33

Issue

3

Start / End Page

729 / 737

Related Subject Headings

  • Networking & Telecommunications
  • Electrical & Electronic Engineering
  • 0910 Manufacturing Engineering
  • 0906 Electrical and Electronic Engineering