Inverse scattering for high-resolution interferometric microscopy.


Journal Article

We extend the applicability of inverse scattering for optical coherence tomography (OCT) to the case of high numerical aperture focusing optics. We include the effects of tight focusing so that the approach is applicable to any interferometric microscopy method. The applicability to modalities, such as OCT and optical coherence microscopy, enables computed reconstruction of three-dimensional volumes from en face temporal ranging data. Simulations show that the computed structure outside of the focal plane exhibits spatially invariant resolution on par with the resolution achieved at the focal plane.

Full Text

Duke Authors

Cited Authors

  • Ralston, TS; Marks, DL; Boppart, SA; Carney, PS

Published Date

  • December 2006

Published In

Volume / Issue

  • 31 / 24

Start / End Page

  • 3585 - 3587

PubMed ID

  • 17130911

Pubmed Central ID

  • 17130911

Electronic International Standard Serial Number (EISSN)

  • 1539-4794

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/ol.31.003585


  • eng