Planar integrated optical methods for examining thin films and their surface adlayers.

Journal Article (Review;Journal Article)

Thin film integrated optical waveguides (IOWs) have gained acceptance as a method for characterizing ultrathin dielectrical films and adlayers bound to the film surface. Here, we present the expressions that govern IOW methods as well as describe the common experimental configurations used in attenuated total reflection, fluorescence and Raman applications. The applications of these techniques to the study of adsorbed or surface-bound proteins to polymer and glass waveguides are reviewed.

Full Text

Duke Authors

Cited Authors

  • Plowman, TE; Saavedra, SS; Reichert, WM

Published Date

  • March 1, 1998

Published In

Volume / Issue

  • 19 / 4-5

Start / End Page

  • 341 - 355

PubMed ID

  • 9677149

Electronic International Standard Serial Number (EISSN)

  • 1878-5905

International Standard Serial Number (ISSN)

  • 0142-9612

Digital Object Identifier (DOI)

  • 10.1016/s0142-9612(97)00113-0


  • eng