Planar integrated optical methods for examining thin films and their surface adlayers.
Journal Article (Review;Journal Article)
Thin film integrated optical waveguides (IOWs) have gained acceptance as a method for characterizing ultrathin dielectrical films and adlayers bound to the film surface. Here, we present the expressions that govern IOW methods as well as describe the common experimental configurations used in attenuated total reflection, fluorescence and Raman applications. The applications of these techniques to the study of adsorbed or surface-bound proteins to polymer and glass waveguides are reviewed.
Full Text
Duke Authors
Cited Authors
- Plowman, TE; Saavedra, SS; Reichert, WM
Published Date
- March 1, 1998
Published In
Volume / Issue
- 19 / 4-5
Start / End Page
- 341 - 355
PubMed ID
- 9677149
Electronic International Standard Serial Number (EISSN)
- 1878-5905
International Standard Serial Number (ISSN)
- 0142-9612
Digital Object Identifier (DOI)
- 10.1016/s0142-9612(97)00113-0
Language
- eng