Assured epitaxial CoSi2phase formation on (001) Si-on-insulator substrates using CoSi/Ti bimetallic source materials


Journal Article

We report an assured way of forming epitaxial CoSi2films on (001) SOI Si substrates when Co is inexhaustible. This is to use bimetallic CoSi/Ti source materials. For the more commonly used Co/Ti source material, epitaxial CoSi2film forms before the Si layer is fully consumed. After the SOI Si has been fully consumed, however, pre-formed epitaxial CoSi2reverted back to polycrystalline CoSi, leading to a dramatic sheet resistance increase. This phase reversal phenomenon arises because in using atomic Co as source material, the Gibbs free energy reduction in forming the CoSi and CoSi2phases is not too different and consequently CoSi becomes the energetically favorable end phase when Co is still available after all Si atoms have been consumed. In using CoSi as the Co source material, the only energetically favorable reaction is to form CoSi2.

Duke Authors

Cited Authors

  • Hsia, SL; Tan, TY; Smith, PL; McGuire, GE

Published Date

  • December 1, 1994

Published In

Start / End Page

  • 123 - 124

International Standard Serial Number (ISSN)

  • 0743-1562

Citation Source

  • Scopus