DETECTION OF POINT DEFECT CHAINS IN ION IRRADIATED SILICON BY HIGH RESOLUTION ELECTRON MICROSCOPY.

Duke Authors

Cited Authors

  • Krakow, W; Tan, TY; Foell, H

Published Date

  • 1981

Published In

  • Mat Res Soc Symp Proc

Start / End Page

  • 185 - 190

Citation Source

  • SciVal