Quadrature spectral interferometric detection and pulse shaping

Journal Article (Journal Article)

We introduce a new variant of spectral interferometry, using spectrally dispersed ultrafast laser pulses and quadrature detection to measure optical thickness variations related to surface structure. We can resolve surface features with depths of 3 mm to 25 nm, using a lateral resolution of ∼100 μm. Quadrature detection gives a larger dynamic range and solves the sign ambiguity problem. This method has potential applications in device manufacture, optical communications, and error compensation in pulse shaping. © 2001 Optical Society of America.

Full Text

Duke Authors

Cited Authors

  • Huang, F; Yang, W; Warren, WS

Published Date

  • March 15, 2001

Published In

Volume / Issue

  • 26 / 6

Start / End Page

  • 382 - 384

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/OL.26.000382

Citation Source

  • Scopus