Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry.

Published

Journal Article

We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-window (DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-light source is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and 6.98 mum on the top and bottom layers, respectively. The DW method decomposes each OCT A-scan into a time-frequency distribution with simultaneously high spectral and spatial resolution. The spectral information from localized regions in the sample is used to determine scatterer structure. The results show that the two scatterer populations can be differentiated using LSS and fLCI.

Full Text

Duke Authors

Cited Authors

  • Robles, FE; Wax, A

Published Date

  • February 2010

Published In

Volume / Issue

  • 35 / 3

Start / End Page

  • 360 - 362

PubMed ID

  • 20125721

Pubmed Central ID

  • 20125721

Electronic International Standard Serial Number (EISSN)

  • 1539-4794

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/ol.35.000360

Language

  • eng