Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes

Journal Article (Journal Article)

Differential capacitance-voltage (C-V) measurements were performed on Al and Pt rectifying contacts fabricated on natural (type IIb) diamonds. The C-V data showed frequency dependence, which decreased significantly after reducing the back contact impedance. The frequency dependence seems primarily to be an effect of the contact capacitance, contact resistance, and bulk resistance of diamond. A model which includes these variables has been proposed to explain this frequency dependence using both large and small back contact impedances.

Full Text

Duke Authors

Cited Authors

  • Venkatesan, V; Das, K; Von Windheim, JA; Geis, MW

Published Date

  • December 1, 1993

Published In

Volume / Issue

  • 63 / 8

Start / End Page

  • 1065 - 1067

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.109834

Citation Source

  • Scopus