Measurement of the decay B0→π-+ ν and determination of

Journal Article (Journal Article)

We present a measurement of the charmless semileptonic decay B0→π ℓ ν using a data sample containing 657×106 BB̄ events collected with the Belle detector at the KEKB asymmetric-energy e e collider operating near the Υ(4S) resonance. We determine the total branching fraction of the decay, B(B0→π ℓ ν)=(1.49±0.04(stat) ±0.07(syst))×10 4. We also report a new precise measurement of the differential decay rate and extract the Cabibbo-Kobayashi- Maskawa matrix element |V | using model-independent and model-dependent approaches. From a simultaneous fit to the measured differential decay rate and lattice QCD results, we obtain |V |=(3.43±0. 33)×10 3, where the error includes both experimental and theoretical uncertainties. © 2011 American Physical Society. - + + - - + - - ub ub

Full Text

Duke Authors

Cited Authors

  • Ha, H; Won, E; Adachi, I; Aihara, H; Aziz, T; Bakich, AM; Balagura, V; Barberio, E; Bay, A; Belous, K; Bhardwaj, V; Bhuyan, B; Bischofberger, M; Bondar, A; Bozek, A; Bračko, M; Browder, TE; Chao, Y; Chen, A; Chen, P; Cheon, BG; Chiang, CC; Cho, IS; Cho, K; Choi, KS; Choi, Y; Dalseno, J; Danilov, M; Doležal, Z; Drutskoy, A; Dungel, W; Eidelman, S; Gabyshev, N; Golob, B; Haba, J; Hayasaka, K; Hayashii, H; Horii, Y; Hoshi, Y; Hou, WS; Hsiung, YB; Hyun, HJ; Iijima, T; Inami, K; Itoh, R; Iwabuchi, M; Iwasaki, Y; Joshi, NJ; Julius, T; Kang, JH; Kawasaki, T; Kiesling, C; Kim, HJ; Kim, HO; Kim, MJ; Kim, SK; Kim, YJ; Kinoshita, K; Ko, BR; Korpar, S; Križan, P; Kuhr, T; Kumita, T; Kuzmin, A; Kwon, YJ; Kyeong, SH; Lange, JS; Lee, MJ; Lee, SH; Li, Y; Limosani, A; Liu, C; Liu, Y; Liventsev, D; Louvot, R; McOnie, S; Miyabayashi, K; Miyata, H; Miyazaki, Y; Mohanty, GB; Mori, T; Nagasaka, Y; Nakano, E; Nakao, M; Nakazawa, H; Natkaniec, Z; Neubauer, S; Nishida, S; Nishimura, K; Nitoh, O; Nozaki, T; Ogawa, S; Ohshima, T; Okuno, S; Olsen, SL; Pakhlov, P; Pakhlova, G; Park, CW; Park, H; Park, HK

Published Date

  • April 1, 2011

Published In

Volume / Issue

  • 83 / 7

Electronic International Standard Serial Number (EISSN)

  • 1550-2368

International Standard Serial Number (ISSN)

  • 1550-7998

Digital Object Identifier (DOI)

  • 10.1103/PhysRevD.83.071101

Citation Source

  • Scopus