Test scheduling for wafer-level test-during-burn-in of core-based SoCs

Conference Paper

Full Text

Duke Authors

Cited Authors

  • Bahukudumbi, S; Chakrabarty, K; Kacprowicz, R

Published Date

  • January 1, 2008

Published In

Start / End Page

  • 1462 - +

Published By

Pages

  • 2

International Standard Serial Number (ISSN)

  • 1530-1591

International Standard Book Number 13 (ISBN-13)

  • 978-3-9810801-3-1

Conference Name

  • Design, Automation and Test in Europe Conference and Exhibition (DATE 08)

Conference Location

  • Munich, GERMANY

Conference Start Date

  • March 10, 2008

Conference End Date

  • March 14, 2008