ECT failure rate among specific devices - Drs. Krystal and Weiner reply

Published

Journal Article (Letter)

Full Text

Duke Authors

Cited Authors

  • Krystal, AD; Weiner, RD

Published Date

  • June 1, 2001

Published In

Volume / Issue

  • 158 / 6

Start / End Page

  • 974 - 974

Published By

Pages

  • 1

International Standard Serial Number (ISSN)

  • 0002-953X

Language

  • English