Ellipsometry-based process monitoring and control for ultrathin gate dielectrics

Conference Paper

Full Text

Duke Authors

Cited Authors

  • Massoud, HZ

Cited Editors

  • Deen, MJ; Brown, WD; Sundaram, KB; Raider, SI

Published Date

  • January 1, 1997

Published In

  • Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films

Volume / Issue

  • 97 / 10

Start / End Page

  • 208 - 216

Published By

Pages

  • 9

International Standard Book Number 10 (ISBN-10)

  • 1-56677-137-4

Conference Name

  • Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films

Conference Location

  • MONTREAL, CANADA

Conference Start Date

  • May 4, 1997

Conference End Date

  • May 9, 1997