Ellipsometry-based process monitoring and control for ultrathin gate dielectrics
Conference Paper
Full Text
Duke Authors
Cited Authors
- Massoud, HZ
Cited Editors
- Deen, MJ; Brown, WD; Sundaram, KB; Raider, SI
Published Date
- January 1, 1997
Published In
- Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
Volume / Issue
- 97 / 10
Start / End Page
- 208 - 216
Published By
Pages
- 9
International Standard Book Number 10 (ISBN-10)
- 1-56677-137-4
Conference Name
- Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
Conference Location
- MONTREAL, CANADA
Conference Start Date
- May 4, 1997
Conference End Date
- May 9, 1997