C-V MEASUREMENT AND SIMULATION OF SILICON-INSULATOR-SILICON (SIS) STRUCTURES FOR ANALYZING CHARGES IN BURIED OXIDES OF BONDED SOI MATERIALS

Journal Article (Academic article)

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Duke Authors

Massoud, Hisham Z.

Cited Authors

MITANI, K; MASSOUD, HZ

Published Date

1992

Published In

Ieice Transactions on Electronics

Volume / Issue

E75C / 12

Start / End Page

1421 - 1429

Electronic International Standard Serial Number (EISSN)

1745-1353

International Standard Serial Number (ISSN)

0916-8524