Exponential Asymptotics for Thin Film Rupture.
Publication
, Journal Article
Chapman, SJ; Trinh, PH; Witelski, TP
Published in: SIAM J. Appl. Math.
2013
Duke Scholars
Published In
SIAM J. Appl. Math.
DOI
Publication Date
2013
Volume
73
Start / End Page
232 / 253
Related Subject Headings
- Applied Mathematics
- 4901 Applied mathematics
- 0102 Applied Mathematics
Citation
APA
Chicago
ICMJE
MLA
NLM
Chapman, S. J., Trinh, P. H., & Witelski, T. P. (2013). Exponential Asymptotics for Thin Film Rupture. SIAM J. Appl. Math., 73, 232–253. https://doi.org/10.1137/120872012
Chapman, S Jonathan, Philippe H. Trinh, and Thomas P. Witelski. “Exponential Asymptotics for Thin Film Rupture.” SIAM J. Appl. Math. 73 (2013): 232–53. https://doi.org/10.1137/120872012.
Chapman SJ, Trinh PH, Witelski TP. Exponential Asymptotics for Thin Film Rupture. SIAM J Appl Math. 2013;73:232–53.
Chapman, S. Jonathan, et al. “Exponential Asymptotics for Thin Film Rupture.” SIAM J. Appl. Math., vol. 73, 2013, pp. 232–53. Dblp, doi:10.1137/120872012.
Chapman SJ, Trinh PH, Witelski TP. Exponential Asymptotics for Thin Film Rupture. SIAM J Appl Math. 2013;73:232–253.
Published In
SIAM J. Appl. Math.
DOI
Publication Date
2013
Volume
73
Start / End Page
232 / 253
Related Subject Headings
- Applied Mathematics
- 4901 Applied mathematics
- 0102 Applied Mathematics