Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details
Publication
, Journal Article
Chen, J; Tobon, L; Huo Liu, Q
Published in: Microwave and Optical Technology Letters
August 1, 2013
An efficient locally implicit discontinuous Galerkin finite element method is proposed for time domain analysis of 3D layered problems. The vector mixed finite elements with discontinuous Galerkin method are employed for spatial discretization, and the singly diagonally implicit Runge-Kutta scheme is used for time stepping. The block Thomas algorithm is utilized during time integration to eliminate the subdomain-based iteration. Numerical examples demonstrate the proposed method is efficient in simulating 3D layered structures containing electrically small components. Copyright © 2013 Wiley Periodicals, Inc.
Published In
Microwave and Optical Technology Letters
DOI
EISSN
1098-2760
ISSN
0895-2477
Publication Date
August 1, 2013
Volume
55
Issue
8
Start / End Page
1912 / 1916
Related Subject Headings
- Networking & Telecommunications
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
- 1005 Communications Technologies
- 0906 Electrical and Electronic Engineering
- 0205 Optical Physics
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, J., Tobon, L., & Huo Liu, Q. (2013). Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters, 55(8), 1912–1916. https://doi.org/10.1002/mop.27673
Chen, J., L. Tobon, and Q. Huo Liu. “Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details.” Microwave and Optical Technology Letters 55, no. 8 (August 1, 2013): 1912–16. https://doi.org/10.1002/mop.27673.
Chen J, Tobon L, Huo Liu Q. Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters. 2013 Aug 1;55(8):1912–6.
Chen, J., et al. “Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details.” Microwave and Optical Technology Letters, vol. 55, no. 8, Aug. 2013, pp. 1912–16. Scopus, doi:10.1002/mop.27673.
Chen J, Tobon L, Huo Liu Q. Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters. 2013 Aug 1;55(8):1912–1916.
Published In
Microwave and Optical Technology Letters
DOI
EISSN
1098-2760
ISSN
0895-2477
Publication Date
August 1, 2013
Volume
55
Issue
8
Start / End Page
1912 / 1916
Related Subject Headings
- Networking & Telecommunications
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
- 1005 Communications Technologies
- 0906 Electrical and Electronic Engineering
- 0205 Optical Physics