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Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details

Publication ,  Journal Article
Chen, J; Tobon, L; Huo Liu, Q
Published in: Microwave and Optical Technology Letters
August 1, 2013

An efficient locally implicit discontinuous Galerkin finite element method is proposed for time domain analysis of 3D layered problems. The vector mixed finite elements with discontinuous Galerkin method are employed for spatial discretization, and the singly diagonally implicit Runge-Kutta scheme is used for time stepping. The block Thomas algorithm is utilized during time integration to eliminate the subdomain-based iteration. Numerical examples demonstrate the proposed method is efficient in simulating 3D layered structures containing electrically small components. Copyright © 2013 Wiley Periodicals, Inc.

Published In

Microwave and Optical Technology Letters

DOI

EISSN

1098-2760

ISSN

0895-2477

Publication Date

August 1, 2013

Volume

55

Issue

8

Start / End Page

1912 / 1916

Related Subject Headings

  • Networking & Telecommunications
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics
 

Citation

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Chen, J., Tobon, L., & Huo Liu, Q. (2013). Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters, 55(8), 1912–1916. https://doi.org/10.1002/mop.27673
Chen, J., L. Tobon, and Q. Huo Liu. “Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details.” Microwave and Optical Technology Letters 55, no. 8 (August 1, 2013): 1912–16. https://doi.org/10.1002/mop.27673.
Chen J, Tobon L, Huo Liu Q. Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters. 2013 Aug 1;55(8):1912–6.
Chen, J., et al. “Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details.” Microwave and Optical Technology Letters, vol. 55, no. 8, Aug. 2013, pp. 1912–16. Scopus, doi:10.1002/mop.27673.
Chen J, Tobon L, Huo Liu Q. Locally implicit discontinuous Galerkin finite element method for transient analysis of 3D layered structures with electrically small details. Microwave and Optical Technology Letters. 2013 Aug 1;55(8):1912–1916.
Journal cover image

Published In

Microwave and Optical Technology Letters

DOI

EISSN

1098-2760

ISSN

0895-2477

Publication Date

August 1, 2013

Volume

55

Issue

8

Start / End Page

1912 / 1916

Related Subject Headings

  • Networking & Telecommunications
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics