Enhanced SPR Sensitivity with Nano-Micro-Ribbon Grating-an Exhaustive Simulation Mapping

Journal Article

Duke Authors

Cited Authors

  • Chamtouri, M; Dhawan, A; Besbes, M; Moreau, J; Ghalila, H; Vo-Dinh, T; Canva, M

Published Date

  • 2013

Published In

Start / End Page

  • 1 - 14

Electronic International Standard Serial Number (EISSN)

  • 1557-1963

International Standard Serial Number (ISSN)

  • 1557-1955

Citation Source

  • Scopus