Progress on PEEM3 - An aberration corrected X-ray photoemission electron microscope at the ALS

Conference Paper

A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and built at the Advanced Light Source (ALS). An electron mirror combined with a much-simplified magnetic dipole separator is to be used to provide simultaneous correction of spherical and chromatic aberrations. It is installed on an elliptically polarized undulator (EPU) beamline, and will be operated with very high spatial resolution and high flux to study the composition, structure, electric and magnetic properties of complex materials. The instrument has been designed and is described. The instrumental hardware is being deployed in 2 phases. The first phase is the deployment of a standard PEEM type microscope consisting of the standard linear array of electrostatic electron lenses. The second phase will be the installation of the aberration corrected upgrade to improve resolution and throughput. This paper describes progress as the instrument enters the commissioning part of the first phase. © 2007 American Institute of Physics.

Full Text

Duke Authors

Cited Authors

  • MacDowell, AA; Feng, J; Demello, A; Doran, A; Duarte, R; Forest, E; Kelez, N; Marcus, MA; Miller, T; Padmore, HA; Raoux, S; Robin, D; Scholl, A; Schlueter, R; Schmid, P; Stöhr, J; Wan, W; Wei, DH; Wu, Y

Published Date

  • March 27, 2007

Published In

Volume / Issue

  • 879 /

Start / End Page

  • 1341 - 1344

Electronic International Standard Serial Number (EISSN)

  • 1551-7616

International Standard Serial Number (ISSN)

  • 0094-243X

International Standard Book Number 10 (ISBN-10)

  • 0735403732

International Standard Book Number 13 (ISBN-13)

  • 9780735403734

Digital Object Identifier (DOI)

  • 10.1063/1.2436312

Citation Source

  • Scopus