TIME RESOLVED TEM OF LASER-INDUCED PHASE TRANSITIONS IN a-Ge AND a-Si/Al-FILMS.

Published

Conference Paper

This paper presents an improved new method for studying the dynamics of laser induced phase transitions down to the submicron-nanosecond scale by means of a modified commercial Transmission Electron Microscope (TEM). Results on Pulsed Laser Annealing (PLA) of amorphous Germanium and a-Si/Al films are described. Potential applications and limits of this method are briefly discussed.

Duke Authors

Cited Authors

  • Bostanjoglo, O; Endruschat, FE; Tornow, W

Published Date

  • December 1, 1986

Published In

Volume / Issue

  • 71 /

Start / End Page

  • 345 - 350

International Standard Serial Number (ISSN)

  • 0272-9172

International Standard Book Number 10 (ISBN-10)

  • 0931837375

Citation Source

  • Scopus