Structured illumination quantitative phase microscopy for enhanced resolution amplitude and phase imaging.

Published

Journal Article

Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introduce an analogue to conventional SIM that allows sub-diffraction resolution, quantitative phase-contrast imaging of optically transparent objects. We demonstrate sub-diffraction resolution amplitude and quantitative-phase imaging of phantom targets and enhanced resolution quantitative-phase imaging of cells. We report a phase accuracy to within 5% and phase noise of 0.06 rad.

Full Text

Duke Authors

Cited Authors

  • Chowdhury, S; Izatt, J

Published Date

  • January 2013

Published In

Volume / Issue

  • 4 / 10

Start / End Page

  • 1795 - 1805

PubMed ID

  • 24156044

Pubmed Central ID

  • 24156044

Electronic International Standard Serial Number (EISSN)

  • 2156-7085

International Standard Serial Number (ISSN)

  • 2156-7085

Digital Object Identifier (DOI)

  • 10.1364/boe.4.001795

Language

  • eng