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Application of OMEMS technology in trapped ion quantum computing

Publication ,  Conference
Crain, S; Mount, E; Baek, SY; Kim, J; Maunz, P
Published in: International Conference on Optical MEMS and Nanophotonics
October 2, 2015

Scalability is one of the main challenges of trapped ion based quantum computation, partly limited by the ability to manipulate the increasing number of quantum bits (qubits). For individual addressing of qubits, microelectromechanical systems (MEMS) technology allows one to design movable micromirrors to focus laser beams on individual ions and steer the focal point in two dimensions. This system is able to scale to multiple beams, has switching speeds comparable to typical single qubit gate times, and has negligible crosstalk on neighboring ions.

Duke Scholars

Published In

International Conference on Optical MEMS and Nanophotonics

DOI

EISSN

2160-5041

ISSN

2160-5033

ISBN

9781467368346

Publication Date

October 2, 2015

Volume

02-05-August-2015
 

Citation

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Chicago
ICMJE
MLA
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Crain, S., Mount, E., Baek, S. Y., Kim, J., & Maunz, P. (2015). Application of OMEMS technology in trapped ion quantum computing. In International Conference on Optical MEMS and Nanophotonics (Vol. 02-05-August-2015). https://doi.org/10.1109/OMN.2015.7288890
Crain, S., E. Mount, S. Y. Baek, J. Kim, and P. Maunz. “Application of OMEMS technology in trapped ion quantum computing.” In International Conference on Optical MEMS and Nanophotonics, Vol. 02-05-August-2015, 2015. https://doi.org/10.1109/OMN.2015.7288890.
Crain S, Mount E, Baek SY, Kim J, Maunz P. Application of OMEMS technology in trapped ion quantum computing. In: International Conference on Optical MEMS and Nanophotonics. 2015.
Crain, S., et al. “Application of OMEMS technology in trapped ion quantum computing.” International Conference on Optical MEMS and Nanophotonics, vol. 02-05-August-2015, 2015. Scopus, doi:10.1109/OMN.2015.7288890.
Crain S, Mount E, Baek SY, Kim J, Maunz P. Application of OMEMS technology in trapped ion quantum computing. International Conference on Optical MEMS and Nanophotonics. 2015.

Published In

International Conference on Optical MEMS and Nanophotonics

DOI

EISSN

2160-5041

ISSN

2160-5033

ISBN

9781467368346

Publication Date

October 2, 2015

Volume

02-05-August-2015