Robust spot fitting for genetic spot array images
Publication
, Conference
Chen, HY; Brändle, N; Bischof, H; Lapp, H
Published in: IEEE International Conference on Image Processing
December 1, 2000
In this paper we address the problem of reliably fitting parametric and semi-parametric models to high density spot array images obtained in gene expression experiments. The goal is to measure the amount of genetic material at specific spot locations. Many spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots we use robust M-estimators. When the parametric method fails, we use a novel, robust semi-parametric method which can handle spots of different shapes accurately. We present the results for real data and compare the complexity of the two methods.
Duke Scholars
Published In
IEEE International Conference on Image Processing
Publication Date
December 1, 2000
Volume
3
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, H. Y., Brändle, N., Bischof, H., & Lapp, H. (2000). Robust spot fitting for genetic spot array images. In IEEE International Conference on Image Processing (Vol. 3).
Chen, H. Y., N. Brändle, H. Bischof, and H. Lapp. “Robust spot fitting for genetic spot array images.” In IEEE International Conference on Image Processing, Vol. 3, 2000.
Chen HY, Brändle N, Bischof H, Lapp H. Robust spot fitting for genetic spot array images. In: IEEE International Conference on Image Processing. 2000.
Chen, H. Y., et al. “Robust spot fitting for genetic spot array images.” IEEE International Conference on Image Processing, vol. 3, 2000.
Chen HY, Brändle N, Bischof H, Lapp H. Robust spot fitting for genetic spot array images. IEEE International Conference on Image Processing. 2000.
Published In
IEEE International Conference on Image Processing
Publication Date
December 1, 2000
Volume
3