Skip to main content

A generic and robust approach for the analysis of spot array images

Publication ,  Journal Article
Brändle, N; Bischof, H; Lapp, H
Published in: Proceedings of SPIE-The International Society for Optical Engineering
January 1, 2001

We present a generic and robust image analysis approach applicable to image data resulting from a broad class of hybridization experiments. The ultimate image analysis goal is to automatically assign a quantity to every array element (spot), giving information about the hybridization signal. Irrespective of the quantification strategy, the most important preliminary information to extract about a spot is the mapping between its location in the digital image and its position in the spot grid (grid fitting). We present a grid fitting approach divided into a spot amplification step (matched filter), a rotation estimation step (Radon transform) and a grid spanning step. Quantification of the hybridization signals is performed with different fitting approaches. The primary approach is a robust fitting of a parametric model with the help of M-estimators. The main advantage of parametric spot fitting is its ability to cope with overlapping spots. If the goodness-of-fit is too bad, a semi-parametric spot fitting is employed.

Duke Scholars

Published In

Proceedings of SPIE-The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4266

Start / End Page

1 / 12
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Brändle, N., Bischof, H., & Lapp, H. (2001). A generic and robust approach for the analysis of spot array images. Proceedings of SPIE-The International Society for Optical Engineering, 4266, 1–12. https://doi.org/10.1117/12.427983
Brändle, N., H. Bischof, and H. Lapp. “A generic and robust approach for the analysis of spot array images.” Proceedings of SPIE-The International Society for Optical Engineering 4266 (January 1, 2001): 1–12. https://doi.org/10.1117/12.427983.
Brändle N, Bischof H, Lapp H. A generic and robust approach for the analysis of spot array images. Proceedings of SPIE-The International Society for Optical Engineering. 2001 Jan 1;4266:1–12.
Brändle, N., et al. “A generic and robust approach for the analysis of spot array images.” Proceedings of SPIE-The International Society for Optical Engineering, vol. 4266, Jan. 2001, pp. 1–12. Scopus, doi:10.1117/12.427983.
Brändle N, Bischof H, Lapp H. A generic and robust approach for the analysis of spot array images. Proceedings of SPIE-The International Society for Optical Engineering. 2001 Jan 1;4266:1–12.

Published In

Proceedings of SPIE-The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4266

Start / End Page

1 / 12