Skip to main content
Journal cover image

Invited - UWB path loss characterization in residential environments

Publication ,  Conference
Ghassemzadeh, SS; Tarokh, V
Published in: 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3
January 1, 2003

Duke Scholars

Published In

2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3

ISSN

0149-645X

ISBN

0-7803-7695-1

Publication Date

January 1, 2003

Start / End Page

365 / 368

Location

PHILADELPHIA, PA

Publisher

IEEE

Conference Name

IEEE MTT-S International Microwave Symposium
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Ghassemzadeh, S. S., & Tarokh, V. (2003). Invited - UWB path loss characterization in residential environments. In H. Thal (Ed.), 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 (pp. 365–368). PHILADELPHIA, PA: IEEE.
Ghassemzadeh, S. S., and V. Tarokh. “Invited - UWB path loss characterization in residential environments.” In 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, edited by H. Thal, 365–68. IEEE, 2003.
Ghassemzadeh SS, Tarokh V. Invited - UWB path loss characterization in residential environments. In: Thal H, editor. 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3. IEEE; 2003. p. 365–8.
Ghassemzadeh, S. S., and V. Tarokh. “Invited - UWB path loss characterization in residential environments.” 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, edited by H. Thal, IEEE, 2003, pp. 365–68.
Ghassemzadeh SS, Tarokh V. Invited - UWB path loss characterization in residential environments. In: Thal H, editor. 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3. IEEE; 2003. p. 365–368.
Journal cover image

Published In

2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3

ISSN

0149-645X

ISBN

0-7803-7695-1

Publication Date

January 1, 2003

Start / End Page

365 / 368

Location

PHILADELPHIA, PA

Publisher

IEEE

Conference Name

IEEE MTT-S International Microwave Symposium