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Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE)

Publication ,  Conference
Hollender, P; Bottenus, N; Bradway, D; Trahey, G
Published in: IEEE International Ultrasonics Symposium, IUS
October 31, 2017

Comb-Push Ultrasound Shear Elastography (CUSE) uses ultrasound beams focused simultaneously at multiple laterally-offset positions to induce shear waves in tissue, and uses the local propagation of the waves to estimate tissue elasticity everywhere in the extended field of view. Single Track Location Shear Wave Elasticity Imaging (STL-SWEI) uses sequentially excited and tracked shear waves from closely-spaced lateral positions to create high-resolution maps of elasticity by suppressing speckle noise in the estimate. We propose and demonstrate here a method of combining these two techniques to realize the high resolution of STL-SWEI with reduced acquisition time from comb-pushes.

Duke Scholars

Published In

IEEE International Ultrasonics Symposium, IUS

DOI

EISSN

1948-5727

ISSN

1948-5719

ISBN

9781538633830

Publication Date

October 31, 2017
 

Citation

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Hollender, P., Bottenus, N., Bradway, D., & Trahey, G. (2017). Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE). In IEEE International Ultrasonics Symposium, IUS. https://doi.org/10.1109/ULTSYM.2017.8091901
Hollender, P., N. Bottenus, D. Bradway, and G. Trahey. “Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE).” In IEEE International Ultrasonics Symposium, IUS, 2017. https://doi.org/10.1109/ULTSYM.2017.8091901.
Hollender P, Bottenus N, Bradway D, Trahey G. Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE). In: IEEE International Ultrasonics Symposium, IUS. 2017.
Hollender, P., et al. “Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE).” IEEE International Ultrasonics Symposium, IUS, 2017. Scopus, doi:10.1109/ULTSYM.2017.8091901.
Hollender P, Bottenus N, Bradway D, Trahey G. Single track location Comb-Push Ultrasound Shear Elastography (STL-CUSE). IEEE International Ultrasonics Symposium, IUS. 2017.

Published In

IEEE International Ultrasonics Symposium, IUS

DOI

EISSN

1948-5727

ISSN

1948-5719

ISBN

9781538633830

Publication Date

October 31, 2017