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Factor structure of the positive and negative syndrome scale (PANSS) in people at ultra high risk (UHR) for psychosis.

Publication ,  Journal Article
Yang, Z; Lim, K; Lam, M; Keefe, R; Lee, J
Published in: Schizophr Res
November 2018

INTRODUCTION: The Positive and Negative Syndrome Scale (PANSS), a comprehensive psychopathology assessment scale used in the evaluation of psychopathology in schizophrenia, is also often used in the Ultra-High-Risk (UHR) population. This paper examined the dimensional structure of the PANSS in a UHR sample. METHODS: A total of 168 individuals assessed to be at UHR for psychosis on the Comprehensive Assessment of At-Risk Mental States (CAARMS) were evaluated on the PANSS, Calgary Depression Scale for Schizophrenia (CDSS), Beck Anxiety Inventory (BAI), Brief Assessment of Cognition in Schizophrenia (BACS), and Global Assessment of Functioning (GAF). Exploratory factor analysis (EFA) of the PANSS was performed to identify the factorial structure. Convergent validity was explored with the CAARMS, CDSS, BAI and BACS. RESULTS: EFA of the PANSS yielded five symptom factors - Positive, Negative, Cognition/Disorganization, Anxiety/Depression, and Hostility. This 5-factor solution showed good convergent validity with the CAARMS composite score, CDSS, BAI, and BACS. Positive, Negative and Anxiety/Depression factors were associated with functioning. CONCLUSION: The reported PANSS factor structure may serve to improve the understanding and measurement of clinical symptom dimensions manifested in people with UHR for future research and clinical setting.

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Published In

Schizophr Res

DOI

EISSN

1573-2509

Publication Date

November 2018

Volume

201

Start / End Page

85 / 90

Location

Netherlands

Related Subject Headings

  • Young Adult
  • Risk
  • Psychotic Disorders
  • Psychiatry
  • Psychiatric Status Rating Scales
  • Male
  • Longitudinal Studies
  • Humans
  • Female
  • Factor Analysis, Statistical
 

Citation

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Yang, Z., Lim, K., Lam, M., Keefe, R., & Lee, J. (2018). Factor structure of the positive and negative syndrome scale (PANSS) in people at ultra high risk (UHR) for psychosis. Schizophr Res, 201, 85–90. https://doi.org/10.1016/j.schres.2018.05.024
Yang, Zixu, Keane Lim, Max Lam, Richard Keefe, and Jimmy Lee. “Factor structure of the positive and negative syndrome scale (PANSS) in people at ultra high risk (UHR) for psychosis.Schizophr Res 201 (November 2018): 85–90. https://doi.org/10.1016/j.schres.2018.05.024.
Yang, Zixu, et al. “Factor structure of the positive and negative syndrome scale (PANSS) in people at ultra high risk (UHR) for psychosis.Schizophr Res, vol. 201, Nov. 2018, pp. 85–90. Pubmed, doi:10.1016/j.schres.2018.05.024.
Journal cover image

Published In

Schizophr Res

DOI

EISSN

1573-2509

Publication Date

November 2018

Volume

201

Start / End Page

85 / 90

Location

Netherlands

Related Subject Headings

  • Young Adult
  • Risk
  • Psychotic Disorders
  • Psychiatry
  • Psychiatric Status Rating Scales
  • Male
  • Longitudinal Studies
  • Humans
  • Female
  • Factor Analysis, Statistical