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A New Method for Low-Capacitance Probing

Publication ,  Journal Article
Carlosena, A; Cabeza, R; Serrano, L
Published in: IEEE Transactions on Instrumentation and Measurement
January 1, 1993
Published version (DOI)

In this paper a method is suggested to cancel the input capacitance of instruments and probes used in measurements. This is proposed as an alternative to conventional attenuating passive and active probes. The idea is demonstrated with a practical device that is able to nullify the parasitic capacitance to less than 2 pF without introducing signal attenuation. © 1993 IEEE

Duke Scholars

Roberto Cabeza
Author Roberto Cabeza Psychology & Neuroscience
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Published In

IEEE Transactions on Instrumentation and Measurement

DOI

10.1109/19.231608

EISSN

1557-9662

ISSN

0018-9456

Publication Date

January 1, 1993

Volume

42

Issue

3

Start / End Page

775 / 778

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0299 Other Physical Sciences
 

Citation

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ICMJE
MLA
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Carlosena, A., Cabeza, R., & Serrano, L. (1993). A New Method for Low-Capacitance Probing. IEEE Transactions on Instrumentation and Measurement, 42(3), 775–778. https://doi.org/10.1109/19.231608
Carlosena, A., R. Cabeza, and L. Serrano. “A New Method for Low-Capacitance Probing.” IEEE Transactions on Instrumentation and Measurement 42, no. 3 (January 1, 1993): 775–78. https://doi.org/10.1109/19.231608.
Carlosena A, Cabeza R, Serrano L. A New Method for Low-Capacitance Probing. IEEE Transactions on Instrumentation and Measurement. 1993 Jan 1;42(3):775–8.
Carlosena, A., et al. “A New Method for Low-Capacitance Probing.” IEEE Transactions on Instrumentation and Measurement, vol. 42, no. 3, Jan. 1993, pp. 775–78. Scopus, doi:10.1109/19.231608.
Carlosena A, Cabeza R, Serrano L. A New Method for Low-Capacitance Probing. IEEE Transactions on Instrumentation and Measurement. 1993 Jan 1;42(3):775–778.

Published In

IEEE Transactions on Instrumentation and Measurement

DOI

10.1109/19.231608

EISSN

1557-9662

ISSN

0018-9456

Publication Date

January 1, 1993

Volume

42

Issue

3

Start / End Page

775 / 778

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0299 Other Physical Sciences