Sequential Detection of Regime Changes in Neural Data
Publication
, Journal Article
Banerjee, T; Allsop, S; Tye, KM; Ba, D; Tarokh, V
Published in: International IEEE/EMBS Conference on Neural Engineering, NER
May 16, 2019
The problem of detecting changes in firing patterns in neural data is studied. The problem is formulated as a quickest change detection (QCD) problem. Important algorithms from the literature are reviewed. A new algorithmic technique is discussed to detect deviations from learned baseline behavior. The algorithms studied can be applied to both spike and local field potential data. The algorithms are applied to mice spike data to verify the presence of behavioral learning.
Duke Scholars
Published In
International IEEE/EMBS Conference on Neural Engineering, NER
DOI
EISSN
1948-3554
ISSN
1948-3546
Publication Date
May 16, 2019
Volume
2019-March
Start / End Page
139 / 142
Citation
APA
Chicago
ICMJE
MLA
NLM
Banerjee, T., Allsop, S., Tye, K. M., Ba, D., & Tarokh, V. (2019). Sequential Detection of Regime Changes in Neural Data. International IEEE/EMBS Conference on Neural Engineering, NER, 2019-March, 139–142. https://doi.org/10.1109/NER.2019.8716926
Banerjee, T., S. Allsop, K. M. Tye, D. Ba, and V. Tarokh. “Sequential Detection of Regime Changes in Neural Data.” International IEEE/EMBS Conference on Neural Engineering, NER 2019-March (May 16, 2019): 139–42. https://doi.org/10.1109/NER.2019.8716926.
Banerjee T, Allsop S, Tye KM, Ba D, Tarokh V. Sequential Detection of Regime Changes in Neural Data. International IEEE/EMBS Conference on Neural Engineering, NER. 2019 May 16;2019-March:139–42.
Banerjee, T., et al. “Sequential Detection of Regime Changes in Neural Data.” International IEEE/EMBS Conference on Neural Engineering, NER, vol. 2019-March, May 2019, pp. 139–42. Scopus, doi:10.1109/NER.2019.8716926.
Banerjee T, Allsop S, Tye KM, Ba D, Tarokh V. Sequential Detection of Regime Changes in Neural Data. International IEEE/EMBS Conference on Neural Engineering, NER. 2019 May 16;2019-March:139–142.
Published In
International IEEE/EMBS Conference on Neural Engineering, NER
DOI
EISSN
1948-3554
ISSN
1948-3546
Publication Date
May 16, 2019
Volume
2019-March
Start / End Page
139 / 142