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Pulsed JR-FEL applications for the characterization of infrared optical materials

Publication ,  Conference
Mu, R; Henderson, DO; Johnson, JB; Edwards, GS
Published in: Proceedings of SPIE - The International Society for Optical Engineering
July 27, 1994

Theoretical consideration of thermal lens effect due to linear and nonlinear opiical absorption is presented. Based on this model, Zscan technique, especially two-color Z-scan can be used to detect very low level of unpurities or defects in optical materials. Depending upon the optical crs section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

July 27, 1994

Volume

2138

Start / End Page

97 / 106
 

Citation

APA
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ICMJE
MLA
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Mu, R., Henderson, D. O., Johnson, J. B., & Edwards, G. S. (1994). Pulsed JR-FEL applications for the characterization of infrared optical materials. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2138, pp. 97–106). https://doi.org/10.1117/12.181347
Mu, R., D. O. Henderson, J. B. Johnson, and G. S. Edwards. “Pulsed JR-FEL applications for the characterization of infrared optical materials.” In Proceedings of SPIE - The International Society for Optical Engineering, 2138:97–106, 1994. https://doi.org/10.1117/12.181347.
Mu R, Henderson DO, Johnson JB, Edwards GS. Pulsed JR-FEL applications for the characterization of infrared optical materials. In: Proceedings of SPIE - The International Society for Optical Engineering. 1994. p. 97–106.
Mu, R., et al. “Pulsed JR-FEL applications for the characterization of infrared optical materials.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 2138, 1994, pp. 97–106. Scopus, doi:10.1117/12.181347.
Mu R, Henderson DO, Johnson JB, Edwards GS. Pulsed JR-FEL applications for the characterization of infrared optical materials. Proceedings of SPIE - The International Society for Optical Engineering. 1994. p. 97–106.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

July 27, 1994

Volume

2138

Start / End Page

97 / 106