Pulsed JR-FEL applications for the characterization of infrared optical materials
Publication
, Conference
Mu, R; Henderson, DO; Johnson, JB; Edwards, GS
Published in: Proceedings of SPIE - The International Society for Optical Engineering
July 27, 1994
Theoretical consideration of thermal lens effect due to linear and nonlinear opiical absorption is presented. Based on this model, Zscan technique, especially two-color Z-scan can be used to detect very low level of unpurities or defects in optical materials. Depending upon the optical crs section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
July 27, 1994
Volume
2138
Start / End Page
97 / 106
Citation
APA
Chicago
ICMJE
MLA
NLM
Mu, R., Henderson, D. O., Johnson, J. B., & Edwards, G. S. (1994). Pulsed JR-FEL applications for the characterization of infrared optical materials. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2138, pp. 97–106). https://doi.org/10.1117/12.181347
Mu, R., D. O. Henderson, J. B. Johnson, and G. S. Edwards. “Pulsed JR-FEL applications for the characterization of infrared optical materials.” In Proceedings of SPIE - The International Society for Optical Engineering, 2138:97–106, 1994. https://doi.org/10.1117/12.181347.
Mu R, Henderson DO, Johnson JB, Edwards GS. Pulsed JR-FEL applications for the characterization of infrared optical materials. In: Proceedings of SPIE - The International Society for Optical Engineering. 1994. p. 97–106.
Mu, R., et al. “Pulsed JR-FEL applications for the characterization of infrared optical materials.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 2138, 1994, pp. 97–106. Scopus, doi:10.1117/12.181347.
Mu R, Henderson DO, Johnson JB, Edwards GS. Pulsed JR-FEL applications for the characterization of infrared optical materials. Proceedings of SPIE - The International Society for Optical Engineering. 1994. p. 97–106.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
July 27, 1994
Volume
2138
Start / End Page
97 / 106