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Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions.

Publication ,  Journal Article
Cohen, E; Elfassy, N; Koplovitz, G; Yochelis, S; Shusterman, S; Kumah, DP; Yacoby, Y; Clarke, R; Paltiel, Y
Published in: Sensors (Basel, Switzerland)
January 2011

In recent years, epitaxial growth of self-assembled quantum dots has offered a way to incorporate new properties into existing solid state devices. Although the droplet heteroepitaxy method is relatively complex, it is quite relaxed with respect to the material combinations that can be used. This offers great flexibility in the systems that can be achieved. In this paper we review the structure and composition of a number of quantum dot systems grown by the droplet heteroepitaxy method, emphasizing the insights that these experiments provide with respect to the growth process. Detailed structural and composition information has been obtained using surface X-ray diffraction analyzed by the COBRA phase retrieval method. A number of interesting phenomena have been observed: penetration of the dots into the substrate ("nano-drilling") is often encountered; interdiffusion and intermixing already start when the group III droplets are deposited, and structure and composition may be very different from the one initially intended.

Duke Scholars

Published In

Sensors (Basel, Switzerland)

DOI

EISSN

1424-8220

ISSN

1424-8220

Publication Date

January 2011

Volume

11

Issue

11

Start / End Page

10624 / 10637

Related Subject Headings

  • Analytical Chemistry
  • 4606 Distributed computing and systems software
  • 4104 Environmental management
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 3103 Ecology
  • 0906 Electrical and Electronic Engineering
  • 0805 Distributed Computing
  • 0602 Ecology
  • 0502 Environmental Science and Management
 

Citation

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Cohen, E., Elfassy, N., Koplovitz, G., Yochelis, S., Shusterman, S., Kumah, D. P., … Paltiel, Y. (2011). Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions. Sensors (Basel, Switzerland), 11(11), 10624–10637. https://doi.org/10.3390/s111110624
Cohen, Eyal, Naomi Elfassy, Guy Koplovitz, Shira Yochelis, Sergey Shusterman, Divine P. Kumah, Yizhak Yacoby, Roy Clarke, and Yossi Paltiel. “Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions.Sensors (Basel, Switzerland) 11, no. 11 (January 2011): 10624–37. https://doi.org/10.3390/s111110624.
Cohen E, Elfassy N, Koplovitz G, Yochelis S, Shusterman S, Kumah DP, et al. Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions. Sensors (Basel, Switzerland). 2011 Jan;11(11):10624–37.
Cohen, Eyal, et al. “Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions.Sensors (Basel, Switzerland), vol. 11, no. 11, Jan. 2011, pp. 10624–37. Epmc, doi:10.3390/s111110624.
Cohen E, Elfassy N, Koplovitz G, Yochelis S, Shusterman S, Kumah DP, Yacoby Y, Clarke R, Paltiel Y. Surface x-ray diffraction results on the III-V droplet heteroepitaxy growth process for quantum dots: recent understanding and open questions. Sensors (Basel, Switzerland). 2011 Jan;11(11):10624–10637.

Published In

Sensors (Basel, Switzerland)

DOI

EISSN

1424-8220

ISSN

1424-8220

Publication Date

January 2011

Volume

11

Issue

11

Start / End Page

10624 / 10637

Related Subject Headings

  • Analytical Chemistry
  • 4606 Distributed computing and systems software
  • 4104 Environmental management
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 3103 Ecology
  • 0906 Electrical and Electronic Engineering
  • 0805 Distributed Computing
  • 0602 Ecology
  • 0502 Environmental Science and Management